Wroclaw University of Technology De Gruyter Open Materials Science
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Back Issues


The section contains back issues papers
of Materials Science-Poland.


Semiconductor Heterostructures and Device Structures Investigated By Photoreflectance Spectroscopy

J. Misiewicz, P. Sitarek, G. Sęk, R. Kudrawiec
Institute of Physics, Wrocław University of Technology, Poland

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Thermal Characterization of Copper Thin Films Made by Means of Sputtering

R.F. Szeloch, W.M. Posadkowski, T.P. Gotszalk, P.Janus, T. Kowaliw
Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland

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Application of Electrostatic Force Microscopy in Nanosystem Diagnostics

T.P. Gotszalk1, P. Grabiec2, I.W. Rangelow3
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
2Institute of Electron Technology, Warsaw, Poland
3Institute of Technological Physics, University of Kassel, Germany

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The Hydrogenation Process of the Gd3Ni Compound

N.V.Tristan1, T. Palewski1, H. Drulis2, L. Folcik2, S.A. Nikitin1,3
1International Laboratory of High Magnetic Fields and Low Temperatures, Wrocław, Poland
2Institute of Low Temperatures and Structure Research, Wrocław, Poland
3Faculty of Physics, Moscow State University, Vorobievy Gory, Russia

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Wavelet Shrinkage-based Noise Reduction From The High Resolution X-ray Images of Epitaxial Layers

J. Kozłowski1, J. Serafińczuk1, A. Kozik2
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
2Institute of Engineering Cybernetics, Wrocław University of Technology, Poland

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Combined SNOM/AFM Microscopy with Micromachined Nanoapertures

J. Radojewski1, P. Grabiec2
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
2Institute of Electron Technology, Warsaw, Poland

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